Title of article
Testability and test compaction for decision diagram circuits
Author/Authors
Bystrov، نويسنده , , A.; Almaini، نويسنده , , A.E.A.، Almaini, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
6
From page
153
To page
158
Journal title
I E T Circuits, Devices and Systems
Serial Year
1999
Journal title
I E T Circuits, Devices and Systems
Record number
371314
Link To Document