مرکز منطقه ای اطلاع رساني علوم و فناوري - Fault coverage and defect level estimation models for partially testable MCMs

Title of article :

Fault coverage and defect level estimation models for partially testable MCMs

Author/Authors :

Tseng، نويسنده , , W.-D.; Wang، نويسنده , , K.، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2000

Pages :

From page :

119

To page :

124

Journal title :

I E T Circuits, Devices and Systems

Serial Year :

2000

Journal title :

I E T Circuits, Devices and Systems

Record number :

371361

Link To Document :