مرکز منطقه ای اطلاع رساني علوم و فناوري - Account of photoelectron elastic determination of overlayer thickness, in-depth profiling, escape depth, attenuation coefficients and intensities in surface systems

Title of article :

Account of photoelectron elastic determination of overlayer thickness, in-depth profiling, escape depth, attenuation coefficients and intensities in surface systems

Author/Authors :

V. I. Nefedov and I. S. Fedorova، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 1997

Pages :

From page :

221

To page :

248

Keywords :

Overlayer thickness determination , Attenuation lengths of photoelectrons insolids , Elastic scattering , In-depth profiling

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

1997

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

378808

Link To Document :

https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=378808