مرکز منطقه ای اطلاع رساني علوم و فناوري - Escape probability of O 1s photoelectrons leaving copper oxide

Title of article :

Escape probability of O 1s photoelectrons leaving copper oxide

Author/Authors :

S. Hucek، نويسنده , , J. Zemek and A. Jablonski، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 1997

Pages :

From page :

257

To page :

262

Keywords :

CuO , Mean escape depth , Depth distribution function , Escape probability of photoelectrons , Overlayer method

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

1997

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

378810

Link To Document :