مرکز منطقه ای اطلاع رساني علوم و فناوري - An experimental comparison of the total-electron-yield and conversion-electron-yield modes for near-surface characterization using X-ray excitation

Title of article :

An experimental comparison of the total-electron-yield and conversion-electron-yield modes for near-surface characterization using X-ray excitation

Author/Authors :

Y. S. Zheng and L. Gao، نويسنده , , S. Hayakawa and Y. Gohshi، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 1997

Pages :

From page :

To page :

Keywords :

Probing depth , Photoelectron , Auger electron , Secondary electron , Total electron yield , Conversion electron yield

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

1997

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

378844

Link To Document :