Title of article
An experimental comparison of the total-electron-yield and conversion-electron-yield modes for near-surface characterization using X-ray excitation
Author/Authors
Y. S. Zheng and L. Gao، نويسنده , , S. Hayakawa and Y. Gohshi، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
9
From page
81
To page
89
Keywords
Probing depth , Photoelectron , Auger electron , Secondary electron , Total electron yield , Conversion electron yield
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year
1997
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number
378844
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