مرکز منطقه ای اطلاع رساني علوم و فناوري - The influence of the photoelectron elastic scattering on the photoelectron diffraction patterns, in-depth profiling and thin film thickness determination

Title of article :

The influence of the photoelectron elastic scattering on the photoelectron diffraction patterns, in-depth profiling and thin film thickness determination

Author/Authors :

V.I. Nefedov and I.S. Fedorova، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 1998

Pages :

From page :

509

To page :

516

Keywords :

Elastic scattering , Thin film thickness

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

1998

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

378946

Link To Document :

https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=378946