Title of article :
Design of an input lens system for a 180° deflection toroidal analyser using trajectory simulation
Author/Authors :
S. Shiraki، نويسنده , , H. Ishii، نويسنده , , M. Owari and Y. Nihei، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Keywords :
180 ° deflection toroidal analyser , Photo- and Auger electron diffraction , Input lens system , Focusing property , Trajectory simulation , Aberration
Journal title :
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Journal title :
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA