مرکز منطقه ای اطلاع رساني علوم و فناوري - X–ray spectroscopy as the method of investigation of the electron structure in disordered semiconductors

Title of article :

X–ray spectroscopy as the method of investigation of the electron structure in disordered semiconductors

Author/Authors :

V. A. Terekhov، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 1998

Pages :

From page :

To page :

Keywords :

X-ray spectroscopy , local density of electron states , disordered semiconductors

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

1998

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

379163

Link To Document :