مرکز منطقه ای اطلاع رساني علوم و فناوري - Dissociative photoionization of SiF4 around the Si 2p edge: a new TOFMS study with improved mass resolution

Title of article :

Dissociative photoionization of SiF4 around the Si 2p edge: a new TOFMS study with improved mass resolution

Author/Authors :

A. C. F. Santos، نويسنده , , C. A. Lucas and G. G. B. de Souza، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2001

Pages :

From page :

115

To page :

121

Keywords :

PEPICO , TOFMS , photoionization , SiF4

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2001

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

379477

Link To Document :