مرکز منطقه ای اطلاع رساني علوم و فناوري - Investigation of the (√3×√3)R30° Sb/Si(111) structure by means of X-ray photoelectron diffraction

Title of article :

Investigation of the (√3×√3)R30° Sb/Si(111) structure by means of X-ray photoelectron diffraction

Author/Authors :

C. Westphal، نويسنده , , M. Schürmann، نويسنده , , S. Dreiner and H. Zacharias، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2001

Pages :

From page :

437

To page :

442

Keywords :

Low index crystal surfaces , Antimony , Photoelectron diffraction , Silicon , X-ray photoelectron spectroscopy

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2001

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

379524

Link To Document :