Title of article :
Determination of the phase composition of surface layers of porous silicon by ultrasoft X-ray spectroscopy and X-ray photoelectron spectroscopy techniques
Author/Authors :
V. A. Terekhov، نويسنده , , V. M. Kashkarov، نويسنده , , E.Yu. Manukovskii، نويسنده , , A. V. Schukarev and E. P. Domashevskaya، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
6
From page :
895
To page :
900
Keywords :
X-ray photoelectron spectroscopy , Porous silicon , Mathematical simulation of the spectra , X-ray emission spectra
Journal title :
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year :
2001
Journal title :
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number :
379598
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=379598
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