Title of article :
Quantitative XPS: I. Analysis of X-ray photoelectron intensities from elemental data in a digital photoelectron database
Author/Authors :
M. P. Seah، نويسنده , , I. S. Gilmore and S. J. Spencer، نويسنده ,
Pages :
19
From page :
93
To page :
111
Keywords :
REELS , XPS , Databases , Quantification , Relative sensitivity factors
Journal title :
Astroparticle Physics
Record number :
379663
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=379663
