مرکز منطقه ای اطلاع رساني علوم و فناوري - Determination of parameters of the local atomic surrounding in surface layers of Fe, Ni and Cu by the secondary electron fine structure method

Title of article :

Determination of parameters of the local atomic surrounding in surface layers of Fe, Ni and Cu by the secondary electron fine structure method

Author/Authors :

D. E. Guy and Yu. V. Ruts، نويسنده , , D. V. Surnin، نويسنده , , A. N. Deev، نويسنده , , Yu. V. Ruts and V. I. Grebennikov، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2002

Pages :

From page :

To page :

Keywords :

Secondary electron spectroscopy , SEFS , Atomic pair correlation function , EELFS , inverse problem , Extended fine structure , EXAFS

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2002

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

379769

Link To Document :