مرکز منطقه ای اطلاع رساني علوم و فناوري - Non-destructive depth profiling of solid samples by atomic and nuclear interactions induced by charged particles

Title of article :

Non-destructive depth profiling of solid samples by atomic and nuclear interactions induced by charged particles

Author/Authors :

Guy Demortier، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2003

Pages :

From page :

243

To page :

271

Keywords :

PIXE , RBS , Depth distribution , Alloys , Archaeological material , NRA

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2003

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

379888

Link To Document :