Title of article
Near edge X-ray absorption fine structure spectroscopy of chemically modified porous silicon
Author/Authors
Y. F. Hu ، نويسنده , , R. Boukherroub and T. K. Sham، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
5
From page
143
To page
147
Keywords
X-ray absorption spectroscopy , Organic monolayer , NEXAFS , Porous silicon
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year
2004
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number
379964
Link To Document