مرکز منطقه ای اطلاع رساني علوم و فناوري - Image enhancement in photoemission electron microscopy by means of imaging time-of-flight analysis

Title of article :

Image enhancement in photoemission electron microscopy by means of imaging time-of-flight analysis

Author/Authors :

A. Oelsner، نويسنده , , A. Krasyuk، نويسنده , , G. H. Fecher، نويسنده , , C. M. Schneider and G. Sch?nhense، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2004

Pages :

From page :

757

To page :

761

Keywords :

Photoemission electron microscopy , imaging energy filter , Chromatic aberration , Time-of-flight electron spectroscopy , MXCD

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2004

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

380128

Link To Document :