مرکز منطقه ای اطلاع رساني علوم و فناوري - Electron spectroscopy of the interface carbon layer formation on the cleavage surfaces of the layered semiconductor In4Se3 crystals

Title of article :

Electron spectroscopy of the interface carbon layer formation on the cleavage surfaces of the layered semiconductor In4Se3 crystals

Author/Authors :

P.V. Galiy، نويسنده , , A.V. Musyanovych and T.M. Nenchuk، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2005

Pages :

From page :

121

To page :

128

Keywords :

Quantitative X-ray photoelectron spectroscopy , Auger electron spectroscopy , Layered crystals

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2005

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

380175

Link To Document :