مرکز منطقه ای اطلاع رساني علوم و فناوري - High spatial resolution studies of surfaces and small particles using electron beam techniques

Title of article :

High spatial resolution studies of surfaces and small particles using electron beam techniques

Author/Authors :

J.A. Venables and J. Liu، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2005

Pages :

From page :

207

To page :

220

Keywords :

secondary electrons , Auger electrons , UHV electron microscopy , Backscattered electrons , Small particle catalysts , surfaces

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2005

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

380222

Link To Document :