مرکز منطقه ای اطلاع رساني علوم و فناوري - Synchrotron radiation photoabsorption and photoemission spectroscopy for thermal-induced reoriented Si polymer

Title of article :

Synchrotron radiation photoabsorption and photoemission spectroscopy for thermal-induced reoriented Si polymer

Author/Authors :

K.G. Nath، نويسنده , , I. Shimoyama، نويسنده , , T. Sekiguchi and Y. Baba، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2005

Pages :

From page :

323

To page :

326

Keywords :

Laserannealing , Poly(dimethylsilane) , X-ray photoemission spectroscopy , synchrotron radiation , Oriented film , Near-edge X-ray absorption fine structure

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2005

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

380302

Link To Document :

https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=380302