Title of article
Silicon carbide surface oxidation and SiO2/SiC interface formation investigated by soft X-ray synchrotron radiation
Author/Authors
P. Soukiassian and F. Amy، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
6
From page
783
To page
788
Keywords
synchrotron radiation , Oxidation and oxides , Core level photoemission spectroscopy , polytype , silicon carbide , Surfaces and interfaces
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year
2005
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number
380407
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