مرکز منطقه ای اطلاع رساني علوم و فناوري - Noise reduction in X-ray photoelectron spectromicroscopy by a singular value decomposition sorting procedure

Title of article :

Noise reduction in X-ray photoelectron spectromicroscopy by a singular value decomposition sorting procedure

Author/Authors :

John Walton and Neal Fairley، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2005

Pages :

From page :

To page :

Keywords :

SVD , Image , PCA , noise , XPS , Spectromicroscopy

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2005

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

380514

Link To Document :