Title of article
Noise reduction in X-ray photoelectron spectromicroscopy by a singular value decomposition sorting procedure
Author/Authors
John Walton and Neal Fairley، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
12
From page
29
To page
40
Keywords
SVD , Image , PCA , noise , XPS , Spectromicroscopy
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year
2005
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number
380514
Link To Document