Title of article
An X-ray photoelectron spectroscopy study of BaAl2S4 thin films
Author/Authors
Philippe F. Smet، نويسنده , , Jo E. Van Haecke، نويسنده , , Roland L. Van Meirhaeghe and Dirk Poelman، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
5
From page
91
To page
95
Keywords
X-ray photoelectron spectroscopy (XPS) , Electroluminescence , Impurities in semiconductors , Thin films , Thermal annealing , BaAl2S4
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year
2005
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number
380521
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