مرکز منطقه ای اطلاع رساني علوم و فناوري - Valence band electronic structure of V2O5 as determined by resonant soft X-ray emission spectroscopy

Title of article :

Valence band electronic structure of V2O5 as determined by resonant soft X-ray emission spectroscopy

Author/Authors :

O.Yu. Khyzhun، نويسنده , , T. Strunskus، نويسنده , , W. Grünert and Ch. W?ll، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2005

Pages :

From page :

To page :

Keywords :

Vanadium oxide , NEXAFS , Electronic structure , X-ray emission spectroscopy

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2005

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

380539

Link To Document :