Title of article
Implications of Monte Carlo Statistical Errors in Criticality Safety Assessments
Author/Authors
Pevey، Ronald E. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
-55
From page
56
To page
0
Abstract
Most criticality safety calculations are performed using Monte Carlo techniques because of Monte Carloʹs ability to handle complex three-dimensional geometries. For Monte Carlo calculations, the more histories sampled, the lower the standard deviation of the resulting estimates. Therefore, the common intuition is that the more histories the better; as a result, analysts tend to run Monte Carlo analyses as long as possible (or at least to a minimum acceptable uncertainty). For Monte Carlo criticality safety analyses, however, the optimization situation is complicated by the fact that procedures usually require that an extra margin of safety be added because of the statistical uncertainty of the Monte Carlo calculations. This additional safety margin affects the impact of the choice of the calculational standard deviation, both on production and on safety. This paper shows that, under the assumptions of normally distributed benchmarking calculational errors and exact compliance with the upper subcritical limit (USL), the standard deviation that optimizes production is zero, but there is a nonzero value of the calculational standard deviation that minimizes the risk of inadvertently labeling a supercritical configuration as subcritical. Furthermore, this value is shown to be a simple function of the typical benchmarking step outcomes - the bias, the standard deviation of the bias, the USL, and the number of standard deviations added to calculated k-effectives before comparison to the USL.
Keywords
The double exchange model , Thin film , Manganites , Photo-induced conductivity
Journal title
Nuclear Science and Engineering
Serial Year
2006
Journal title
Nuclear Science and Engineering
Record number
38355
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