Title of article :
On the go with SONOS
Author/Authors :
White، نويسنده , , M.H.، نويسنده , , Adams، نويسنده , , D.A.، نويسنده , , Bu، نويسنده , , J.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
10
From page :
22
To page :
31
Abstract :
Advancements in scaling gate insulators for MOS transistors permit low-voltage, silicon-oxide-nitride-silicon (SONOS) nonvolatile semiconductor memories (NVSMs) for a wide range of applications. The continued scaling of SONOS devices offers improved performance with a small cell size, single-level polysilicon with low voltage, fast erase/write, improved memory retention, increased endurance, and radiation hardness. In this article, we discuss scaled SONOS devices, SONOS memory technology, and some SONOS NVSM applications
Journal title :
IEEE Circuits and Devices Magazine
Serial Year :
2000
Journal title :
IEEE Circuits and Devices Magazine
Record number :
397389
Link To Document :
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