Title of article

Failure analysis requirements for nanoelectronics

Author/Authors

Mary Vallett، نويسنده , , D.P.، نويسنده ,

Issue Information

روزنامه با شماره پیاپی سال 2002

Pages

5

From page

117

To page

121

Keywords

Failure analysis (FA) , Fault diagnosis , Inspection , Microscopy , testing.

Journal title

IEEE Transactions on Nanotechnology

Serial Year

2002

Journal title

IEEE Transactions on Nanotechnology

Record number

398300