Title of article
Implementation of surface roughness scattering in Monte Carlo modeling of thin SOI MOSFETs using the effective potential
Author/Authors
Ramey، نويسنده , , S.M.، نويسنده , , Ferry، نويسنده , , D.K.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
5
From page
110
To page
114
Keywords
Monte Carlo methods , MOSFETs , semiconductor-insulator interfaces , quantumtheory , silicon on insulator(SOI) technology.
Journal title
IEEE Transactions on Nanotechnology
Serial Year
2003
Journal title
IEEE Transactions on Nanotechnology
Record number
398337
Link To Document