Title of article :
Failure analysis requirements for nanoelectronics
Author/Authors :
Mary Vallett، نويسنده , , D.P.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Pages :
5
From page :
117
To page :
121
Keywords :
Fault diagnosis , Microscopy , Inspection , testing. , Failure analysis (FA)
Journal title :
IEEE Transactions on Nanotechnology
Serial Year :
2002
Journal title :
IEEE Transactions on Nanotechnology
Record number :
398539
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=398539
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