Title of article
Effects of strong correlations in single electron traps in field-effect transistors
Author/Authors
Mozyrsky، نويسنده , , D.، نويسنده , , Martin، نويسنده , , I.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
6
From page
90
To page
95
Keywords
Impurities , magnetoelectric effects , MOS devices , tunneling.
Journal title
IEEE Transactions on Nanotechnology
Serial Year
2005
Journal title
IEEE Transactions on Nanotechnology
Record number
398704
Link To Document