مرکز منطقه ای اطلاع رساني علوم و فناوري - Investigation of the Effect of Microstructure and Grain Boundaries in Nanostructured CMR Thin Films Using Scanning Tunneling Microscopy (STM) and Local Conductance Map (LCMAP)

Title of article :

Investigation of the Effect of Microstructure and Grain Boundaries in Nanostructured CMR Thin Films Using Scanning Tunneling Microscopy (STM) and Local Conductance Map (LCMAP)

Author/Authors :

Kar، نويسنده , , S.، نويسنده , , Sarkar، نويسنده , , J.، نويسنده , , Raychaudhuri، نويسنده , , A. K.، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2006

Pages :

From page :

707

To page :

711

Keywords :

nanostructured films , Colossal magnetoresistance , scanning tunneling microscopy. , GRAIN BOUNDARIES

Journal title :

IEEE Transactions on Nanotechnology

Serial Year :

2006

Journal title :

IEEE Transactions on Nanotechnology

Record number :

398894

Link To Document :

https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=398894