Title of article
Defect and Transient Fault-Tolerant System Design for Hybrid CMOS/Nanodevice Digital Memories
Author/Authors
Fei Sun، نويسنده , , Tong Zhang، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
11
From page
341
To page
351
Keywords
complementary metal–oxide–semiconductor (CMOS) , defect/faulttolerance , Bose–Chaudhuri–Hocquenghem (BCH) codes , error correcting code (ECC) , hybrid digital memory , nanodevice , very large scale integration (VLSI) implementation.
Journal title
IEEE Transactions on Nanotechnology
Serial Year
2007
Journal title
IEEE Transactions on Nanotechnology
Record number
398948
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