Defect and Transient Fault-Tolerant System Design for Hybrid CMOS/Nanodevice Digital Memories

Fei Sun، نويسنده , , Tong Zhang، نويسنده ,

روزنامه با شماره پیاپی سال 2007

11

341

351

complementary metal–oxide–semiconductor (CMOS) , defect/faulttolerance , Bose–Chaudhuri–Hocquenghem (BCH) codes , error correcting code (ECC) , hybrid digital memory , nanodevice , very large scale integration (VLSI) implementation.

IEEE Transactions on Nanotechnology

2007

IEEE Transactions on Nanotechnology

398948