A novel technique for high impedance fault identification

A novel technique using wavelet analysis filter banks (WAFB) to identify distribution high impedance faults (BDFs) is presented. A new model of HIF is used. HIFs and capacitor bank switching operations are simulated by ElectroMagnetic Transients Program (EMTP) and their current signals are studied. High frequency components with the time localization information uf both HlFs and capacitor bank switching operations are obtained using WAFB and their behavior i s differentiated clearly. Results demonstrate that WAFB can be used as an element in a HZF Detector for fast and accurate identification of distribution BIFs.