Title of article
Minimum average fraction inspected for TCSP-1 plan
Author/Authors
Chen، Chung-Ho نويسنده , , Chou، Chao-Yu نويسنده , , Cheng، Te-Shiang نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
-792
From page
793
To page
0
Abstract
This paper presents the calculation of the average outgoing quality limit (AOQL) for the tightened single-level continuous sampling plan (TCSP-1 plan) based on a numerical method. A solution procedure is developed to find the parameters (i, f, k) that will meet the AOQL requirement, while also minimizing the average fraction inspected (AFI) for the TCSP-1 plan when the process average pmacron(> AOQL) is known.
Keywords
D. Spin-density waves , D. Phase transitions , A. Organic compounds , A. Superconductors
Journal title
JOURNAL OF APPLIED STATISTICS
Serial Year
2001
Journal title
JOURNAL OF APPLIED STATISTICS
Record number
40720
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