Title of article
New developments of computer-aided crystallographic analysis in transmission electron microscopy
Author/Authors
Zaefferer، S. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
0
From page
1
To page
0
Abstract
A computer program for on-line crystal orientation measurements based on spot and Kikuchi electron diffraction patterns in TEM is presented. The program facilitates the complete characterization of lattice defects, such as dislocations and grain boundaries.
Keywords
Infrared spectroscopy , Electronic paramagnetic resonance (EPR) , Fullerenes , Chemical synthesis , Organic compounds
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Serial Year
2000
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Record number
41863
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