Title of article :
Accurate structure-factor measurements using high-energy synchrotron radiation: a test on cuprite, Cu2O
Author/Authors :
Lippmann، T. نويسنده , , Schneider، J. R. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
-155
From page :
156
To page :
0
Abstract :
Structure factors were measured for cuprite, Cu2O, using 100 keV synchrotron radiation, with an accuracy that allowed full multipole refinements.
Keywords :
Fullerenes , Organic compounds , Chemical synthesis , Infrared spectroscopy , Electronic paramagnetic resonance (EPR)
Journal title :
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Serial Year :
2000
Journal title :
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Record number :
41872
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=41872
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