Title of article
Elimination of extrinsic components overlapping lattice distortion variations of a silicon single crystal obtained by double-crystal X-ray topography
Author/Authors
Kudo، Y. نويسنده , , Liu، K.-Y. نويسنده , , Kawado، S. نويسنده , , Hirano، K. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
-225
From page
226
To page
0
Abstract
The new sample-rotation and area-detector-traverse method using X-ray optics for double-crystal X-ray topography was developed in order to measure variations in lattice distortion, free of extrinsic components, of an as-grown silicon single crystal.
Keywords
Fullerenes , Organic compounds , Chemical synthesis , Infrared spectroscopy , Electronic paramagnetic resonance (EPR)
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Serial Year
2000
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Record number
41892
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