Abstract :
We use exact methods to derive an iInterface model from an underlying microscopic
model, i.e., the Ising model on a square lattice. At the wetting transition
in the two-dimensional Ising model, the long Peierls contour (or iInterface) gets
depinned from the substrate. Using exact transfer-matrix methods, we find that
on sufficiently large length scales (i.e., length scales sufficiently larger than the
bulk correlation length) the distribution of the long contour is given by a unique
probability measure corresponding to a continuous ‘‘iInterface model.’’ The
iInterface binding ‘‘potential’’ is a Dirac delta function with support on the
substrate and, therefore, a distribution rather than a function. More precisely,
critical wetting in the two-dimensional Ising model, viewed on length scales
sufficiently larger than the bulk correlation length, is described by a reflected
Brownian motion with a Dirac d perturbation on the substrate so that exactly at
the wetting transition the substrate is a perfectly reflecting surface; otherwise
there exists a d perturbation. A lattice solid-on-solid model was found to give
identical results (albeit with modified parameters) on length scales sufficiently
larger than the lattice spacing, thus demonstrating the universality of the continuous
iInterface model.
Keywords :
critical wetting , exact results , iInterface models , Ising models , solid-on-solid models.