• Title of article

    DC Built-In Self-Test for Linear Analog Circuits

  • Author/Authors

    Abhijit Chatterjee Bruce C. Kim Naveena Nagi ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1996
  • Pages
    8
  • From page
    26
  • To page
    33
  • Abstract
    DC testing of analog circuits is cheaper than AC testing and covers many fault classes, including some that AC tests cannot detect. This efficient, low-cost, built-in self-test (BIST) methodology uses the checksum encodings of matrix representations to uncover faults that affect a circuitʹs DC transfer function
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    1996
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431079

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431079