Title of article
Spanning the Product Life Cycle: RASSP DFT
Author/Authors
Richard M. Sedmak John S. Evans ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1996
Pages
11
From page
32
To page
42
Abstract
This article describes a design for testability process for the RASSP program that is highly automated and hierarchical and also spans the entire life cycle. It features a new construct, the test strategy diagram for managing the test process
Journal title
IEEE Design and Test of Computers
Serial Year
1996
Journal title
IEEE Design and Test of Computers
Record number
431091
Link To Document