Title of article :
Spanning the Product Life Cycle: RASSP DFT
Author/Authors :
Richard M. Sedmak John S. Evans ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1996
Pages :
11
From page :
32
To page :
42
Abstract :
This article describes a design for testability process for the RASSP program that is highly automated and hierarchical and also spans the entire life cycle. It features a new construct, the test strategy diagram for managing the test process
Journal title :
IEEE Design and Test of Computers
Serial Year :
1996
Journal title :
IEEE Design and Test of Computers
Record number :
431091
Link To Document :
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