Title of article :
Spanning the Product Life Cycle: RASSP DFT
Author/Authors :
Richard M. Sedmak
John S. Evans
، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1996
Abstract :
This article describes a design for testability process for the RASSP program that is highly automated and hierarchical and also spans the entire life cycle. It features a new construct, the test strategy diagram for managing the test process
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers