Title of article

The future of IC design, testing, and manufacturing

Author/Authors

Wojciech M، نويسنده ,

Issue Information

روزنامه با شماره پیاپی سال 1996

Pages

3

From page

89

To page

91

Journal title

IEEE Design and Test of Computers

Serial Year

1996

Journal title

IEEE Design and Test of Computers

Record number

431104