• Title of article

    Mapping and Repairing Embedded-Memory Defects

  • Author/Authors

    Lynn Youngs Siva Paramanandam ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1997
  • Pages
    7
  • From page
    18
  • To page
    24
  • Abstract
    Yield is perhaps the single most important measure of manufacturing efficiency for large integrated circuits. To reduce the time to volume production and accelerate continuous yield improvement, the manufacturing flow of the UltraSparc microprocessor includes memory test as well as defect mapping and repair
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    1997
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431121

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431121