Title of article :
Testing Logic-Intensive Memory ICs on Memory Testers
Author/Authors :
Robert Wu
Jerry Gerner
Richard Wheelus
Kevin Lew
، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Abstract :
Presents Lotom, a tool which converts logic test vectors into memory test patterns and generates a corresponding memory test program for use on an economical memory tester. The authors report a sample time savings of 99% over manual conversion
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers
