Title of article
Cost-Driven Ranking of Memory Elements for Partial Intrusion
Author/Authors
Magdy Abadir Rohit Kapur ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
6
From page
45
To page
50
Abstract
DFT techniques such as scan, BIST, or test point insertion intrude the circuitry for ease of testing. However, testing ease incurs increased silicon area requirements and performance penalities. The authors present a method of identifying cost-effect intermediate solutions
Journal title
IEEE Design and Test of Computers
Serial Year
1997
Journal title
IEEE Design and Test of Computers
Record number
431146
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