Title of article
The Economics of System-Level Testing
Author/Authors
Des Farren Tony Ambler ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
8
From page
51
To page
58
Abstract
Competitive pressure to streamline system-level test without affecting product quality is mounting. Identifying the features unique to system-level testing, the authors present key results of production testing based on a new test cost model
Journal title
IEEE Design and Test of Computers
Serial Year
1997
Journal title
IEEE Design and Test of Computers
Record number
431147
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