Title of article :
IC Failure Analysis: The Importance of Test and Diagnostics
Author/Authors :
David P. Vallett، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Abstract :
Continuous improvements in yield, reliability, time to market, and customer satisfaction all benefit from quick corrective action through root-cause failure analysis. The author reviews software- and hardware-based diagnostic methods for fault localization, the first and most critical step in this process
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers