Title of article :
IC Failure Analysis: The Importance of Test and Diagnostics
Author/Authors :
David P. Vallett، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Pages :
7
From page :
76
To page :
82
Abstract :
Continuous improvements in yield, reliability, time to market, and customer satisfaction all benefit from quick corrective action through root-cause failure analysis. The author reviews software- and hardware-based diagnostic methods for fault localization, the first and most critical step in this process
Journal title :
IEEE Design and Test of Computers
Serial Year :
1997
Journal title :
IEEE Design and Test of Computers
Record number :
431150
Link To Document :
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