Author/Authors :
Kenneth M. Butler، نويسنده , , J. Karl Johnson، نويسنده , , Jeff Platt، نويسنده , , Anjali Kinra، نويسنده , , Jayashree Saxena
، نويسنده ,
Abstract :
To meet market demands for the rapid introduction of new semiconductor products, automated means of diagnosing defective silicon are fast becoming mandatory. The authors describe the development and deployment of an automated diagnosis methodology within Texas Instruments
