Title of article
Automated Diagnosis in Testing and Failure Analysis
Author/Authors
Kenneth M. Butler، نويسنده , , J. Karl Johnson، نويسنده , , Jeff Platt، نويسنده , , Anjali Kinra، نويسنده , , Jayashree Saxena ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
7
From page
83
To page
89
Abstract
To meet market demands for the rapid introduction of new semiconductor products, automated means of diagnosing defective silicon are fast becoming mandatory. The authors describe the development and deployment of an automated diagnosis methodology within Texas Instruments
Journal title
IEEE Design and Test of Computers
Serial Year
1997
Journal title
IEEE Design and Test of Computers
Record number
431151
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