Title of article
Conquering Noise in Deep-Submicron Digital Ics
Author/Authors
Kenneth L. Shepard Vinod Narayanan ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
12
From page
51
To page
62
Abstract
As feature sizes decrease and clock frequencies increase, noise is becoming a greater concern in digital IC design. The authors describe a verification metric, noise stability, which guarantees functionality in the presence of noise, and a CAD technique, static noise analysis, for applying this metric on a chipwide basis
Journal title
IEEE Design and Test of Computers
Serial Year
1998
Journal title
IEEE Design and Test of Computers
Record number
431176
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