Title of article :
Integrating Online and Offline Testing of a Switching Memory
Author/Authors :
Stefano Barbagallo، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Abstract :
A circuit used in a telephone switching unit features several test techniques, including BIST, partial scan, and boundary scan. By sharing the same circuitry for both online and offline testing, the design minimizes additional logic while achieving very high fault coverage
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers