• Title of article

    Integrating Online and Offline Testing of a Switching Memory

  • Author/Authors

    Stefano Barbagallo، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1998
  • Pages
    8
  • From page
    63
  • To page
    70
  • Abstract
    A circuit used in a telephone switching unit features several test techniques, including BIST, partial scan, and boundary scan. By sharing the same circuitry for both online and offline testing, the design minimizes additional logic while achieving very high fault coverage
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    1998
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431177

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431177