Title of article :
A D&T Roundtable: Testing Mixed Logic and DRAM Chips
Author/Authors :
Meh-Ron Amerian William D. Atwell، نويسنده , , Jr.، نويسنده , , Ian Burgess Gary D. Fleeman David Y. Lepejian T.w. Williams Farzad Zarrinfar Yervant Zorian ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
7
From page :
86
To page :
92
Journal title :
IEEE Design and Test of Computers
Serial Year :
1998
Journal title :
IEEE Design and Test of Computers
Record number :
431189
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431189
