Title of article :
Testing the 500-MHz IBM S/390 Microprocessor
Author/Authors :
Thomas G. Foote، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
7
From page :
83
To page :
89
Abstract :
The design-for-test framework of the 500-MHz CMOS central processor uses specific tests to ensure the highest reliability of components within a system. Some of the same test patterns are applied in chip manufacturing and system-level tests
Journal title :
IEEE Design and Test of Computers
Serial Year :
1998
Journal title :
IEEE Design and Test of Computers
Record number :
431202
Link To Document :
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